Description

Basic Specifications of PXIe-4145 (NI)

Below are its core basic specifications:

1. Instrument Type

Form Factor: PXI Express (3U single-slot module)
Function: Precision Source Measure Unit (SMU) – integrates voltage sourcing, current sourcing, voltage measurement, and current measurement in one module

2. Sourcing Capabilities

Parameter	Voltage Sourcing Specs	Current Sourcing Specs
Output Range	-20 V to +20 V	-1 A to +1 A (DC) / Peak 3 A (pulsed mode)
Maximum Output Power	20 W (continuous operation)	20 W (continuous operation)
Output Resolution	16-bit (at full scale)	16-bit (at full scale)
Sourcing Accuracy (23 °C ±5 °C)	±0.01% of full scale (FS) ± 25 µV (typical)	±0.01% of full scale (FS) ± 250 nA (typical)
Slew Rate	Up to 10 V/µs (voltage) / Up to 1 A/µs (current)

3. Measurement Capabilities

Measured Quantity	Measurement Range	Resolution	Accuracy (23 °C ±5 °C)
Voltage	-20 V to +20 V	16-bit (at full scale) / 1 µV (at 20 V range)	±0.01% FS ± 10 µV (typical)
Current	-1 A to +1 A (DC) / -3 A to +3 A (pulsed)	16-bit (at full scale) / 100 nA (at 1 A range)	±0.01% FS ± 100 nA (typical)

4. Speed & Throughput

Measurement Rate: Up to 1 MS/s (1 million samples per second) in high-speed mode
Data Transfer: Leverages PXI Express x1 lane – provides up to 250 MB/s bidirectional bandwidth for fast data streaming to/from the host controller
Settling Time: < 1 µs (for voltage/current steps to within 0.1% of final value)

5. Key Features

Multi-Function Integration: Eliminates the need for separate power supplies and DMMs, reducing system size and complexity.
Pulsed Operation: Supports 3 A peak current (pulsed) for testing devices requiring high transient currents (e.g., semiconductors, LEDs).
Software Compatibility: Works with NI LabVIEW, NI TestStand, and SCPI commands for easy system integration and automated test program development.
Protection Mechanisms: Built-in overvoltage protection (OVP), overcurrent protection (OCP), and overtemperature protection (OTP) to safeguard the module and DUT (Device Under Test).

PXIE-4145 National Instruments PDF

PXIe4145

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