8070-0902-13 Laser Head Measurement System new in stock

Description

Brand: ZYGO Corporation
Model: 8070-0902-13
Product Category: High-Precision Optical Interferometer Module (tailored for advanced metrology systems, compatible with ZYGO’s GPI Pro/XPI Pro series interferometers)
Dimensions: 152.4 mm (length) × 101.6 mm (width) × 63.5 mm (height); compact rack-mount compatible form factor for easy integration into ZYGO standard interferometer enclosures
Weight: Approximately 0.6 kg (net weight, excluding optical fiber cables and mounting hardware)

Temperature Range: Operating temperature: 20°C to 24°C (68°F to 75.2°F) for ultra-high measurement precision; Storage temperature: -25°C to 65°C (-13°F to 149°F); Relative humidity: 15% to 75% (non-condensing, per IEC 60068-2-3)
Input Specifications: Optical input: 532 nm solid-state laser (compatible with ZYGO’s high-stability laser modules); Input power range: 1 mW to 10 mW; Electrical input: 12 VDC ± 5%, 800 mA max (for internal control electronics and signal processing circuits)
Output Specifications: Optical output: High-resolution interferometric fringe signal (quadruple-channel, balanced detection); Output bandwidth: 20 MHz max; Electrical output: Differential analog voltage signal (±5 V) proportional to fringe shift, SMA connectors; Digital output: TTL/CMOS level status signals (measurement ready, error alert), D-sub 15 connector
Physical & Environmental Ratings: Protection class: IP31 (per IEC 60529, protection against solid objects ≥2.5 mm and vertical dripping water); Vibration resistance: 0.5 g (10 Hz to 2000 Hz, sinusoidal, per IEC 60068-2-6); Shock resistance: 15 g (11 ms half-sine pulse, per IEC 60068-2-27); Optical surface cleanliness: Class 10 (per ISO 14644-1)

Key Features: Ultra-precision optical path alignment for nanoscale metrology; Low-noise signal processing circuitry for enhanced measurement stability; Seamless compatibility with ZYGO MetroPro Advanced software for data analysis and reporting; RoHS and REACH compliant; Suitable for critical applications including semiconductor wafer inspection, precision optics testing, and aerospace component surface profiling

8070-0902-13 PDF
8070-0902-13

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